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產(chǎn)品名稱:

差分探頭| P6248

更新時間:2024-09-07

產(chǎn)品型號:P6248

產(chǎn)品報價:

產(chǎn)品特點:差分探頭| P6248 ?Low Input Capacitance: <1 pF Differential
?Probe Input Connector: Two Standard 0.025 in./0.63 mm (0.1 in. Center) Square Pin Receptacle (Female)
?Electrostatic Discharge Tolerant (IEC

P6248差分探頭| P6248的詳細(xì)資料:

差分探頭| P6248

差分探頭| P6248

Features & Benefits

P6248

  • 1.7 GHz (Typical Probe Only ≤27 °C) 1X Mode
  • 1.5 GHz Bandwidth (Guaranteed)
  • 1.85 GHz (Typical Probe Only ≤27 °C) 10X Mode

P6247

  • >1.0 GHz Bandwidth (Guaranteed)

P6246

  • 400 MHz Bandwidth (Guaranteed)

General

  • Low Input Capacitance: <1 pF Differential
  • Probe Input Connector: Two Standard 0.025 in./0.63 mm (0.1 in. Center) Square Pin Receptacle (Female)
  • Electrostatic Discharge Tolerant (IEC 801-2)
  • Connects to TekProbe® BNC Interface on TDS Series Oscilloscopes or Other Instruments using 1103 TekProbe® Power Supply
  • For use with Oscilloscopes, Spectrum Analyzers, or Network Analyzers
  • >60 dB (1000:1) Common Mode Rejection Ratio (CMRR)
  • Small Probe Head Allows Easy Probing of SMDs

Applications

  • Communications (Gigabit Ethernet, IEEE-1394, Fibre Channel)
  • Semiconductor Characterization (RAMBUS)
  • Disk Drive Read Channel Design
  • Communication Pulse Shape Compliance
  • Jitter, Crosstalk, and BERT Measurements
  • Location of Ground Bounce

The P6246, P6247, and P6248 Differential Probes

The P6248, P6247, and P6246 enable users to make time-domain or frequency-domain measurements on high-bandwidth signals commonly found in disk drive, digital IC design (RAMBUS), and communication applications (Gigabit Ethernet, IEEE-1394 Firewire, and Fibre Channel). The P6248 includes accessories that allow RAMBUS via probing and IEEE-1394 interconnect access. The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface-mount devices while maintaining high CMRR.

The P6246, P6247, and P6248 are ideal for design verification of disk drive read, channel electronics, and timing analysis for troubleshooting ground-bounce problems associated with high-speed logic. They can also be used for pulse shape or crosstalk compliance testing of high-speed communication signals

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